Integrated Circuit Test Engineering: Modern Techniques

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Integrated Circuit Test Engineering:...

Integrated Circuit Test Engineering: Modern Techniques

Ian A. Grout

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ปี:

2005

ฉบับพิมพ์ครั้งที่:

2006 Edition

สำนักพิมพ์:

Springer

ภาษา:

english

ISBN:

B011DC9BRQ

ไฟล์:

PDF, 14.85 MB

IPFS:

,

english, 2005

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ดาวน์โหลด (pdf, 14.85 MB)

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Ravi Shankar, Eduardo B. Fernandez — Vlsi and Computer Architecture (V L S I Electronics) (v. 20)

Vojin Oklobdzija — Digital Design and Fabrication

Rochit Rajsuman — System-on-a-Chip: Design and Test

Poornima, Mrs.K; Poornima, Mrs.K. — Principles Of CMOS VLSI Design A Full Detailed Text Book: CMOS VLSI Design : A Circuits And Systems

M. Bushnell, V. Agrawal — Essentials of Electronic Testing - For Digital, Memory and Mixed-Signal VLSI Circuits

Unknown — "Analog Integrated Circuits". In: Wiley Encyclopedia of Electrical and Electronics Engineering

姜少杰，王永鼎 — 机电工程专业英语英文

ARRL — Chapter 5 - Electrical Signals and Components

Joseph I. Di Giacomo — Vlsi Handbook: Silicon, Gallium Arsenide, and Superconductor Circuits

Randall Geiger, Noel Strader, N. R. Strader — VLSI Design Techniques for Analog and Digital Circuits (McGraw-Hill Series in Electrical Engineering)

Michael Walsh — Choosing and Using Cmos

Ravi Shankar; Eduardo B Fernandez — VLSI and computer architecture

Peter Shepherd (auth.) — Integrated Circuit Design, Fabrication and Test

Suman Lata Tripathi (editor), Sobhit Saxena (editor), Sushanta Kumar Mohapatra (editor) — Advanced VLSI Design and Testability Issues

Dimitris Gizopoulos — Advances in Electronic Testing: Challenges and Methodologies (Frontiers in Electronic Testing)

Krzysztof Iniewski — Advanced Circuits for Emerging Technologies

Alexander Miczo — Digital Logic Testing and Simulation

Hubert Kaeslin — Digital Integrated Circuit Design: From VLSI Architectures to CMOS Fabrication

M. Bushnell; Vishwani Agrawal — Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

M. Bushnell, Vishwani Agrawal — Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits

Stanley L. Hurst — VLSI Custom Microelectronics: Digital: Analog, and Mixed-Signal

Stanley L. Hurst — VLSI Custom Microelectronics: Digital: Analog, and Mixed-Signal

Wai-Kai Chen — The VLSI handbook

Vojin G. Oklobdzija — Digital Design and Fabrication

Hurst, Stanley Leonard — VLSI testing : digital and mixed analogue/digital techniques

Mohapatra, Sushanta Kumar; Saxena, Sobhit; Tripathi, Suman Lata — Advanced VLSI design and testability issues

Francisco Serra-Graells, Adoración Rueda, José L. Huertas — Low-Voltage CMOS Log Companding Analog Design

Neil Storey — Electronics : a systems approach

Wojciech Białas, Władysław Dabrowski, Paweł Gryboś, Marek Idzik (auth.), Andrzej Napieralski, Zygmunt Ciota, Augustin Martinez, Gilbert De Mey, Joan Cabestany (eds.) — Mixed Design of Integrated Circuits and Systems

Noulis, Thomas — Mixed-signal circuits

Rochit Rajsuman — System-on-a-Chip: Design and Test

Jose Nazario — Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

Stephen F. Bush, Sanjay Goel (auth.), Alexandre Schmid, Sanjay Goel, Wei Wang, Valeriu Beiu, Sandro Carrara (eds.) — Nano-Net: 4th International ICST Conference, Nano-Net 2009, Lucerne, Switzerland, October 18-20, 2009. Proceedings

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